Device-level Simulations of Parasitic Bipolar Mechanism on Preventing MCUs of Redundant Flip-Flops
نویسندگان
چکیده
Parasitic bipolar mechanisms can effectively prevent MCUs of redundant flip-flop, which improve the tolerance of soft errors. Device-level simulations reveals that no MCU occurs in redundant latches storing the opposite values by the parasitic bipolar effect, while MCU occurs by a particle hit with high energy in the redundant latches storing the same value.
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